MCL-E-795G
Halogen Free, High Tg, High Elastic Modulus and Low CTE Material
About the product
- Product
- CCL
-
MCL-E-795G
- Prepreg
-
GEA-795G
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Applications
- Semiconductor packages (FC-BGA)
- Center core of buildup construction
Benefits
- MCL-E-795G has low CTE value in X, Y directions and can reduce warpage of package significantly.
- MCL-E-795G (Type LH) has low CTE value.
- Well-suited for center core of buildup construction.
Characteristics
Warpage Performance [3-2-3 construction]
TEG Substrate
- Package size: 40 mm×40 mm
- Core thickness: 0.4 mm / 0.8 mm
- BU thickness: 20 µm
- SR thickness: 19 µm
TEG Chip
- Die size: 20 mm×20 mm
- Die height: 775 µm



Copper Clad Laminate
(t0.4 mm)
- ※1 Heating Rate: 10 °C/min(Comp.)
- ※2 800 μm thickness.
- ※3 Measured by SPDR.
- ※4 Refer to "Condition Note"
- ※ Above data are experimental results and not guaranteed.
Specifications
Copper Clad Laminate
- Note1)STD: Standard copper foil, LP: Low Profile copper foil, PF: Profile-free copper foil.
- Note2) Laminate thickness means that of dielectric layer thickness.
Prepreg
- ※1 The dielectric thickness after lamination is defined as the thickness of one sheet of prepreg when the resin flow is within 0%.
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