MCL-E-770G (Type R)
Halogen Free, High Tg, High Elastic Modulus, Low CTE Multilayer Material
About the product
- Product
- CCL
-
MCL-E-770G (Type R)
- Prepreg
-
GEA-770G
- Applications
- Semiconductor packages. (FC-CSP, PoP, SiP)
- Thinner module.
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Features
- MCL-E-770G has low CTE values in X, Y directions and reduces warpage of package substrate significantly.
- MCL-E-770G (Type RLH) has lower CTE value (less than 2.0 ppm/℃).
Copper Clad Laminate
Warpage of FC-CSP
- TEG Chip
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- Chip size: 7.3 mm×7.3 mm
- Chip thickness: 150 µm
- Underfill thickness: 60 µm (CEL-C-3730-4)
- Solder Resist thickness: 20 µm (FZ-2700GA)
- TEG Substrate
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- Package size: 14 mm×14 mm
- Core Thickness 200 µm+1024 (S-HD) PPG


Copper Clad Laminate
(t0.2mm)
- ※1 Heating Rate: 10℃/min.
- ※2 Measured by SPDR.
- ※3 Refer to "Condition Note"
- ※4 t0.8mm
- ※t0.4mm thickness core is used depending on test item.
- ※ Above data are experimental results and not guaranteed.
Standard Specifications
Copper Clad Laminate
- ※1 STD: Standard copper foil, LP: Low profile copper foil, PF: Profile free copper foil.
- ※2 STD: 12 µm, 18 µm; LP: 2 µm, 3 µm, 12 µm, 18 µm.
- ※3 In case laminate thickness lies in between two thickness figures shown above, tolerance of such laminate would be equal to the tolerance of thicker one.
- ※4 Laminate thickness means dielectric layer thickness
Prepreg
- ※1 Dielectric thickness after lamination is defined as the thickness of one sheet of prepreg when the resin flow is 0%. Value changes depending on the press condition or inner layer pattern.
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